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Atomic structure characterization of stacking faults on the {1100} plane in α-alumina by scanning transmission electron microscopy, E. Tochigi*, S. D. Findlay, E. Okunishi, T. Mizoguchi, A. Nakamura, N. Shibata, Y. Ikuhara, AIP Conference Proceedings , 1763 , 050003｛https://aip.scitation.org/doi/10.1063/1.4961356｝, Nov. 2016
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