Matsunaga Laboratory

Day by day our lives, societies, and the world around us are becoming increasingly more rich, comfortable and convenient. Still, the earth faces many challenging environmental problems and complex issues such as aging societies and we have to tackle these head on to solve them.

In the laboratory, we study the structure of materials and their micro and macroscopic properties from electronic, atomic and molecular aspects, and aim to connect this expertise to development of various innovative materials, and become pioneers in the area of materials science.

Parallel Computer

This is a parallel computer used in our laboratory.

Stereo microscopes

These are used to check the conditions of samples. We have three stereo microscopes.

Digital Microscope System

This can produce high-quality and full-color optical images of the surfaces of samples.

Imaging Box

This enables us to take nice pictures of small and beautiful objects such as crystals or jewelries.

Laser scanning microscope

This enables us to observe three-dimensional structures with increasing optical resolution.

Furnaces

These are used to heat-treat samples in air at high temperatures.

Atmosphere furnaces

These are used to heat-treat samples in reducing atmosphere at high temperatures.

Furnace for bicrystals

This is a furnace used to fabricate oxide bicrystals.

Water Purification System

This enables purification of water.

Low Speed Precision Cutters

These are used for cutting various types of materials with minimal deformation. We have two cutters.

Ultrasonic Cutter

This enables cutting brittle materials for TEM observation.

Precision polishing machines

These are used to polish brittle materials. We have six polishing machines.

Ion Milling Systems

These can produce high-quality TEM specimens with electron transparency.

Magnetron Sputter Coater

This enables nanoscale thin film deposition on the surface of samples.

Ion Beam Sputtering System

This enables atoms deposition on the surface of samples at the atomic scale.

Precision universal testing machine

This is used to deform materials with measuring displacements and loads.

Nano Indentation Tester

This enables testing the mechanical properties of materials from their surfaces at the nanoscale.

Scanning Probe Microscope

This enables nanoscale measurements of various properties from surfaces of materials.

Semiconductor Parameter Analyzer

This is used for electrical characterization of semiconducting or insulating materials.

Low-Noise Vacuum Prober station

This is used to measure electric properties of materials from low temperature to high temperature.

High Voltage Application System

This cyclically can apply high voltage to a sample.

Spectrophotometer

This enables scientific measurement of reflection and transmission properties of samples as a function of wavelength.

Time-resolved Spectroscopy Equipment

This is used to measure weak phosphorescence spectra and the lifetime.

Xenon Light Sources

This is used to irradiate lights of the specific wavelength domain to materials. We have two xenon light sources.

Mercury Light Source

This is used to irradiate lights of various wavelength domains including short wavelength ultraviolet to materials.

Draft Chamber

This is a local exhaust ventilation, which is used to treat toxic chemical substances.

• Role of phonons on phase stabilization of RE2Si2O7over wide temperature range (RE = Yb, Gd)
  S. Fujii*, A. Ioki, T. Yokoi, M. Yoshiya,
  Journal of the European Ceramic Society 40 (3), 780-788, March 2020

• Dependence of excess vibrational entropies on grain boundary structures in MgO: A first-principles lattice dynamics
  T. Yokoi, Y. Arakawa, K. Ikawa, A. Nakamura, K. Matsunaga,
  Phys. Rev. Mater. , 4 (2020) 026002. DOI: 10.1103/PhysRevMaterials.4.026002

• Neural-network interatomic potential for grain boundary structures and their energetics in silicon
  T. Yokoi, Y. Noda, A. Nakamura, K. Matsunaga,
   Phys. Rev. Mater., 4 (2020) 014605. (published 29 January 2020) DOI: https://doi.org/10.1103/PhysRevMaterials.4.014605

• Light-Illumination Dependent Electronic and Atomic Structures of Glide

  Dislocations in Inorganic Semiconductors,

  K. Matsunaga,

  44th International Conference and Expo on Advanced Ceramics and Composites (ICACC 2020), 2020.1, Invited

• Electronic and Atomic Structures of Dislocations in an Inorganic Semiconductor Showing Unexpected Large Plasticity at Room Temperature,
  K. Matsunaga, Y. Oshima, A. Nakamura,
  The 6th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC6),
  14 – 15 June 2019, Invited

Building 5. of Graduate School of Engineering Furo-chou, Chikusa ku, Nagoya city, Aichi 464-8603

Nagoya University Graduate School of Engineering Department of Materials Science and Engineering

To Higashiyama Campus
From Nagoya Station: Take the Subway Higashiyama Line to Motoyama Sta. (15 minutes), then transfer to the Subway Meijo Line to Nagoya Daigaku Station.