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Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111), A. Yurtsever*, Y. Sugimoto, M. Fukumoto, M. Abe, and S. Morita, Applied Physics Letters, 1, 083119-1/-3｛https://aip.scitation.org/apl/resource/1/applab/v101/i8/p083119_s1｝, Aug. 2012
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